Electron and Positron Spectroscopies in Materials Science and Engineering presents the advances and limitations of instrumentations for surface and interface probing useful to metallurgical applications. It discusses the Auger electron spectroscopy and electron spectroscopy for chemical analysis. It addresses the means to determine the chemistry of the surface. Some of the topics covered in the book are the exo-electron emission; positron annihilation; extended x-ray absorption fine structure; high resolution electron microscopy; uniaxial monotonic deformation-induced dislocation substructure; and analytical electron microscopy. The mechanistic basis for exo-electron spectroscopy is covered. The correlation of fatigue and photoyield are discussed. The text describes the tribostimulated emission. A study of the quantitative measurement of fatigue damage is presented. A chapter is devoted to the fracture of oxide films on aluminium. Another section focuses on the positron annihilation experimental details and the creep-induced dislocation substructure. The book can provide useful information to scientists, engineers, students, and researchers.
Inhaltsverzeichnis
1;Front Cover ;1 2;Electron and Positron Spectroscopies in Materials Science and Engineering;4 3;Copyright Page;5 4;Table of Contents;6 5;List of Contributors;10 6;Preface;12 7;Chapter 1. Mechanistic Basis for Exo-Electron Spectroscopy;20 7.1;I. INTRODUCTION;20 7.2;II. REVIEW OF MECHANICALLY STIMULATED EXO-ELECTRON EMISSION;22 7.3;III. ROUGHNESS AND OXIDE EFFECTS ON PHOTOYIELD OF ALUMINUM;27 7.4;IV. DISCUSSION OF FATIGUE-ENHANCED PHOTOEMISSION;45 7.5;V. SUMMARY AND CONCLUSIONS;48 7.6;ACKNOWLEDGMENTS;50 7.7;REFERENCES;51 8;Chapter 2. Recent Applications of Exo-Electron Emission;54 8.1;I. INTRODUCTION;54 8.2;II. INSTRUMENTATION;55 8.3;III. FRACTURE OF OXIDE FILMS ON ALUMINUM;58 8.4;IV. EXO-ELECTRON EMISSION AND METAL FATIGUE;63 8.5;V. QUANTITATIVE MEASUREMENT OF FATIGUE DAMAGE;66 8.6;VI. SUMMARY;71 8.7;ACKNOWLEDGMENTS;72 8.8;REFERENCES;72 9;Chapter 3. The Detection of Positron Annihilation Processes in Metals;74 9.1;I. INTRODUCTION;74 9.2;II. CONVENTIONAL INSTRUMENTS;76 9.3;III. RECENT DEVELOPMENTS;83 9.4;IV. OUTLOOK;88 9.5;ACKNOWLEDGMENTS;88 9.6;REFERENCES;88 10;Chapter 4. Positron Probing of Microstructures and Substructures in Metals and Alloys;92 10.1;I. INTRODUCTION;92 10.2;II. POSITRON ANNIHILATION EXPERIMENTAL DETAILS;94 10.3;III. RESULTS AND DISCUSSION;96 10.4;IV. POSITRONS AND NONDESTRUCTIVE EVALUATION;134 10.5;REFERENCES;137 11;Chapter 5. Advances in and Quantification of Auger Electron Spectroscopy (AES);140 11.1;I. INTRODUCTION;140 11.2;II. THEORY AND QUANTIFICATION OF AES;143 11.3;III. EXPERIMENTAL TECHNIQUES;190 11.4;ACKNOWLEDGMENT;197 11.5;REFERENCES;197 12;Chapter 6. Applications of Auger Electron Spectroscopy in Ferrous Metallurgy;202 12.1;I. INTRODUCTION;202 12.2;II. QUANTITATIVE AUGER ANALYSIS;203 12.3;III. STUDIES OF EMBRITTLEMENT OF STEEL;216 12.4;IV. SEGREGATION TO FREE SURFACES;218 12.5;V. EFFECTS OF SURFACE-ACTIVE IMPURITIES ON PHASE TRANSFORMATIONS;231 12.6;VI. SUMMARY;234 12.7;ACKNOWLEDGMENTS;235 12.8;REFERENCES;235 13;Chapter 7. Advances in
ESCA Spectroscopy;238 13.1;I. INTRODUCTION;238 13.2;II. THE ESCA TECHNIQUE;239 13.3;.II. SOME QUALITATIVE CHEMICAL ANALYSES OF ESCA APPLICATIONS;244 13.4;IV. QUANTITATIVE ELEMENTAL ANALYSIS;252 13.5;ACKNOWLEDGMENT;259 13.6;REFERENCES;259 14;Chapter 8. EXAFS Studies of Materials;262 14.1;I. INTRODUCTION;262 14.2;II. THEORY AND ANALYSIS OF EXAFS;264 14.3;III. EXPERIMENTAL TECHNIQUE;269 14.4;IV. CRYSTALLINE MATERIALS;274 14.5;V. DISORDERED MATERIALS;279 14.6;VI. SURFACES AND ADSORBATES;285 14.7;VII. CONCLUSION;291 14.8;ACKNOWLEDGMENT;291 14.9;REFERENCES;291 15;Chapter 9. High Resolution Electron Imaging: an Approach to the Atomic Characterization of Materials;294 15.1;I. INTRODUCTION;295 15.2;II. DESCRIPTION OF TECHNIQUE;296 15.3;III. APPLICATIONS;299 15.4;IV. FUTURE DIRECTIONS;329 15.5;V. SUMMARY AND CONCLUSIONS;329 15.6;ACKNOWLEDGMENTS;330 15.7;REFERENCES;331 16;Chapter 10. Analytical Electron Microscopy: X-Ray Microanalysis Using the Scanning Transmission Electron Microscope;334 16.1;I. INTRODUCTION;334 16.2;II. WHY X-RAY MICROANALYSIS IN THE STEM;335 16.3;III. OUTLINE OF X-RAY MICROANALYSIS BASICS;338 16.4;IV. PARAMETERS IN STEM X-RAY MICROANALYSIS;341 16.5;V. QUANTITATIVE MICROANALYSIS;345 16.6;VI. LIMITS OF DETECTABILITY;347 16.7;VII. TYPICAL APPLICATIONS;348 16.8;VIII. FUTURE DIRECTIONS;352 16.9;ACKNOWLEDGMENTS;352 16.10;REFERENCES;353 17;Index;354
