Surface Science Tools for Nanomaterials Characterization

Higher Resolution Scanning Probe Methods for Magnetic Imaging. - The Synchrotron Based VUV Resonant Photoemission for Characterisation of Nanomaterials. - SPM for Characterization of PbSe Nanocrystals. -Scanning Probe Microscopy for Nanolithography. - Kelvin Probe Force Microscopy. -Synchrotron Radiation X-ray Photoelectron Spectroscopy. - Scanning Electrochemical Potential Microscopy (SECPM) and Electrochemical STM (EC-STM). - Band Bending at Metal-Semiconductor and Metal-Ferroelectric Interfaces Investigated by Photoelectron Spectroscopy. - Magnetic Force Microscopy. - High Resolution STM Imaging. -Numerical Simulations on Nanotips for FIM and FEM . -ARPES on Organic Semiconductor Single Crystals Crystalline Films. - FIM-Characterized Tips for SPM. - Scanning Conductive Torsion Mode Microscopy. - Scanning Probe Acceleration Microscopy (SPAM). - Combining Micromanipulation, Kerr Magnetometry and Magnetic Force Microscopy for Characterization of Magnetic Nanostructures. - Field Ion Microscopy (FIM). - Non-Contact Atomic Force Microscopy for Characterization of Nanostructures and Beyond.