Fabrication technologies for nanostructured devices have been developed recently, and the electrical and optical properties of such nanostructures are a subject of advanced research.
This book describes the different approaches to spectroscopic microscopy, i. e. , Electron Beam Probe Spectroscopy, Spectroscopic Photoelectron Microscopy, and Scanning Probe Spectroscopy. It will be useful as a compact source of reference for the experienced reseracher, taking into account at the same time the needs of postgraduate students and nonspecialist researchers by using a tutorial approach throughout.
Inhaltsverzeichnis
Spectro-microscopy by TEM-SEM. - Determination of Nanosize Particle Distribution by Low Frequency Raman Scattering: Comparison to Electron Microscopy. - Development of Cathodoluminescence (CL) for Semiconductor Research, Part I: TEM-CL Study of Microstructures and Defects in Semiconductor Epilayers. - Development of CL for Semiconductor Research, Part II: Cathodoluminescence Study of Semiconductor Nanoparticles and Nanostructures Using Low-Electron-Beam Energies. - Development of CL for Semiconductor Research, Part III: Study of Degradation Mechanisms in Compound Semiconductor-Based Devices by SEM-CL. - Microcharacterization of Conformal GaAs on Si Layers by Spatially Resolved Optical Techniques. - Strain Analysis in Submicron Electron Devices by Convergent Beam Electron Diffraction. - Synchrotron Radiation X-ray Microscopy Based on Zone Plate Optics. - Long-Term Oxidation Behaviour of Lead Sulfide Surfaces. - Cross-Sectional Photoemission Spectromicroscopy of Semiconductor Heterostructures. - Surface Imaging Using Electrons Excited by Metastable-Atom Impacts. - Application of Photoemission Electron Microscopy to Magnetic Domain Imaging. - Photoelectron Spectroscopy with a Photoemission Electron Microscope. - X-ray Photoemission and Low-Energy Electron Microscope. - Application of Imaging-Type Photoelectron Spectromicroscopy to Solid-State Physics. - Scanning Near-Field Optical Spectroscopy of Quantum-Confined Semiconductor Nanostructures. - Novel Tuning Fork Sensor for Low-Temperature Near-Field Spectroscopy. - Manipulating, Reacting, and Constructing Single Molecules with a Scanning Tunneling Microscope Tip. - Electron-Beam-Induced Decomposition of SiO2 Overlay on Si in STM Nanolithography. - Direct Imaging of InGaAs Quantum Dot States by Scanning Tunneling Spectroscopy. - Growth and Characterization of Ge Nanostructures on Si(111). - Imaging of Zero-Dimensional States in Semiconductor Nanostructures Using Scanning Tunneling Microscopy. - Electronic-Excitation-Induced Enhancement in Metallicity on HOPG and Si Surfaces: In Situ STM/STS Studies. - Electronic Properties of Polycrystalline and Amorphous WO3 Investigated with Scanning Tunnelling Spectroscopy. - Probing of Electronic Transitions with Atomic-Scale Spatial Resolution in Semiconductor Quantum Well Structures. - Scanning Tunneling Microscope-Induced Light Emission from Nanoscale Structures.
