Collaert, K. von Arnim, R. Rooyackers, T.
Inhaltsverzeichnis
Synergy Between Design and Technology: A Key Factor in the Evolving Microelectronic Landscape. - EMERGING TECHNOLOGY AND DEVICES. - New State Variable Opportunities Beyond CMOS: A System Perspective. - A Simple Compact Model to Analyze the Impact of Ballistic and Quasi-Ballistic Transport on Ring Oscillator Performance. - ADVANCED DEVICES AND CIRUITS. - Low-Voltage Scaled 6T FinFET SRAM Cells. - Independent-Double-Gate FINFET SRAM Cell for Drastic Leakage Current Reduction. - Metal Gate Effects on a 32 nm Metal Gate Resistor. - RELIABILITY AND SEU. - Threshold Voltage Shift Instability Induced by Plasma Charging Damage in MOSFETS with High-K Dielectric. - Analysis of SI Substrate Damage Induced by Inductively Coupled Plasma Reactor with Various Superposed Bias Frequencies. - POWER, TIMING AND VARIABILITY. - CMOS SOI Technology for WPAN: Application to 60 GHZ LNA. - SRAM Memory Cell Leakage Reduction Design Techniques in 65 nm Low Power PD-SOI CMOS. - Resilient Circuits for Dynamic Variation Tolerance. - Process Variability-Induced Timing Failures A Challenge in Nanometer CMOS Low-Power Design. - How Does Inverse Temperature Dependence Affect Timing Sign-Off. - CMOS Logic Gates Leakage Modeling Under Statistical Process Variations. - On-Chip Circuit Technique for Measuring Jitter and Skew with Picosecond Resolution. - ANALOG AND MIXED SIGNAL. - DC DC Converter Technologies for On-Chip Distributed Power Supply Systems 3D Stacking and Hybrid Operation. - Sampled Analog Signal Processing: From Software-Defined to Software Radio.
