Optical Characterization of Thin Solid Films

Introduction and modelling activities. - Optical film characterization topics: An overview. - Universal dispersion model for characterization of optical thin films over wide spectral range. - Predicting optical properties of oxides from ab initio calculations. - Spectrophotometry and spectral ellipsometry. - Optical characterization of thin films by means of spectroscopic imaging spectrophotometry. - Data processing methods for imaging spectrophotometry. - In-situ and ex-situ spectrophotometry in thin film characterization. - Ellipsometric characterization of thin solid films. - Characterization of defective and corrugated coatings. - Optical characterization of thin films exhibiting defects. - Scanning probe microscopy characterization of optical thin films. - Resonant grating waveguide structures. - Absorption and scatter. - Roughness and scatter in optical coatings. - Absorption and fluorescence measurements in optical coatings. - Cavity ring-down technique for optical coating characterization.